Study of the relation between composition and physical properties of YBaCuO thin films using RBS, NRA, XRD, XAS and ϱ(T)
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M. Sacchi | J. Siejka | I. Trimaille | F. Rochet | C. Ortega | L. Mercandalli | J. Wong | F. Mayca
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M. Sacchi | J. Siejka | I. Trimaille | F. Rochet | C. Ortega | L. Mercandalli | J. Wong | F. Mayca