A March-based fault location algorithm for static random access memories

A March-based fault location algorithm is proposed for the repair of word-oriented static RAMs. A March CL algorithm of complexity 12N, N is the number of memory words, is defined for fault detection and partial diagnosis. A 3N or 4N March-like algorithm is used for location of the aggressor words of inter-word state, idempotent, inversion, write-disturb coupling faults (CF). Then another March-like algorithm of complexity 9(1+logB), B is the number of bits in the word, is applied to locate the aggressor bit in the aggressor word. Finally, a March algorithm of complexity 6(1+logB)N is used to detect and locate intra-word stuck-at, transition faults, as well as CFs. The proposed algorithm has higher fault location ability and lower time complexity than other known algorithms developed for fault location in SRAMs.

[1]  A. J. van de Goor,et al.  Testing Semiconductor Memories: Theory and Practice , 1998 .

[2]  Ad J. van de Goor,et al.  March tests for word-oriented memories , 1998, Proceedings Design, Automation and Test in Europe.

[3]  T. Bergfeld,et al.  Diagnostic testing of embedded memories using BIST , 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537).

[4]  Yervant Zorian,et al.  Built in self repair for embedded high density SRAM , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[5]  Jin-Fu Li,et al.  March-based RAM diagnosis algorithms for stuck-at and coupling faults , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[6]  Yervant Zorian,et al.  An approach for evaluation of redundancy analysis algorithms , 2001, Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing.