On the relation between Frank-Read source nature and fine slip line structure

Slip patterning is influenced by both the distribution of Frank-Read sources in the bulk crystal and the dislocation interactions before emerging at the surface. The fine structure of slip lines is also highly dependent on the intrinsic nature of Frank-Read sources and particularly on their pinning points and external dislocation network, which is often not considered. In this paper, different types of Frank-Read sources are reviewed and the direct effects are described and discussed of these dislocation multiplication mechanisms on the step fine structure at the surface.

[1]  Jean-Christophe Girard,et al.  Plasticity study of deformed materials by in situ atomic force microscopy , 1998 .

[2]  H. Karnthaler,et al.  The f.c.c. to h.c.p. martensitic phase transformation in CoNi studied by TEM and AFM methods , 1997 .

[3]  Y. Bréchet,et al.  Strain softening, slip localization and propagation: From simulations to continuum modelling , 1996 .

[4]  Igor Muševič,et al.  Temperature controlled microstage for an atomic force microscope , 1996 .

[5]  M. Goiran,et al.  Fractal analysis of atomic force microscopy pictures of slip lines on a GaAs/GaAlAs heterostructure plastically deformed to obtain quantum wires , 1996 .

[6]  C. Coupeau,et al.  Atomic force microscopy of in situ deformed LiF , 1995 .

[7]  F. Jensen,et al.  On the nature of cross‐hatch patterns on compositionally graded Si1−xGex alloy layers , 1994 .

[8]  W. Unertl,et al.  A Thermal Stage for Nanoscale Structure Studies with the Scanning Force Microscope , 1994 .

[9]  F. Louchet Organized Dislocation Structures , 1993 .

[10]  M. Ohta,et al.  Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM) , 1993 .

[11]  G. Binnig,et al.  Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum , 1992 .

[12]  P. Pirouz,et al.  Cross-slip and twinning in semiconductors , 1991 .

[13]  E. Meyer,et al.  Atomic resolution on LiF (001) by atomic force microscopy , 1990 .

[14]  P. Pirouz On twinning and polymorphic transformations in compound semiconductors , 1989 .

[15]  Heinrich Rohrer,et al.  7 × 7 Reconstruction on Si(111) Resolved in Real Space , 1983 .

[16]  F. Louchet Thermally activated dislocation sources in silicon , 1980 .

[17]  G. Chin,et al.  Formation of deformation twins in f.c.c. crystals , 1973 .

[18]  G. Saada Sur le durcissement dû à la recombinaison des dislocations , 1960 .

[19]  P. Hirsch,et al.  An electron microscope study of stainless steel deformed in fatigue and simple tension , 1959 .