This paper describes sapphire fiber-based EFPI sensors incorporated with wavelength scanning absolute signal demodulation. Silica-based optical fiber extrinsic Fabry- Perot interferometric (EFPI) sensors have been very successfully used in measuring a wide range of physical and chemical parameters. However, these fibers can only sustain temperatures of 800 degrees C because of germanium thermal diffusion affecting both the attenuation and waveguide multi-mode properties of the fiber. Since sapphire has a melting point above 2000 degrees C, sapphire optical fiber can be potentially used up to 2000 degrees C in an EFPI scheme. We obtain a resolution of 0.02 micrometers with a dynamic range of 27 micrometers for micro-displacement measurement.