论文信息 - Atomic-Scale Mechanisms of Defect-Induced Retention Failure in Ferroelectrics. - 字舞流文

Atomic-Scale Mechanisms of Defect-Induced Retention Failure in Ferroelectrics.

Linze Li | H. Christen | J. Jokisaari | Y. Chu | Xiaoqing Pan | C. Beekman | Yi Zhang | L. Xie | Jan-Chi Yang