论文信息 - A review of fault models for lsi/vlsi devices

A review of fault models for lsi/vlsi devices

The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs

Paolo Prinetto | Silvano Gai | Marco Mezzalama

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