Ultrathin (5 nm) SiGe-On-Insulator with high compressive strain (−2 GPa): From fabrication (Ge enrichment process) to in-depth characterizations
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W. Schwarzenbach | O. Bonnin | J. Hartmann | O. Gourhant | D. Barge | D. Cooper | Y. Morand | D. Rouchon | T. Denneulin | J. Barnes | C. L. Royer | F. Glowacki | J. Pedini | P. Nguyen | E. Baylac | Y. Campidelli