A half-century of Baarda’s concept of reliability: a review, new perspectives, and applications
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Ivandro Klein | Marcelo Tomio Matsuoka | Vinicius Francisco Rofatto | Rüdiger Lehmann | Mauricio Roberto Veronez | M. L. Bonimani | M. Veronez | R. Lehmann | I. Klein | M. T. Matsuoka | V. F. Rofatto | R. Lehmann
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