Quasi-static analysis of shielded microstrip transmission lines with thick electrodes

An extended point-matching method for analyzing the shielded microstrip transmission lines with thick electrodes has been developed based on the method by Marcuse (1989). This method provides a simple and fast approach to the quasi-static analysis of the structures. The calculated fields are used to estimate the characteristic impedance and effective dielectric constant of the structures. The results agree well with available theoretical results obtained using other methods, such as the finite element method and the boundary element method. This method can be further applied to other microstrip lines widely used in monolithic microwave integrated circuits (MMICs) applications.

[1]  Ingo Wolff,et al.  The application of the point matching method to the analysis of microstrip lines with finite metallization thickness , 1988 .

[2]  M. Belanger,et al.  General analysis of electrodes in integrated-optics electrooptic devices , 1991 .

[3]  H. E. Green The Numerical Solution of Some Important Transmission-Line Problems , 1965 .

[4]  R. Vahldieck,et al.  A mode projecting method for the quasi-static analysis of electrooptic device electrodes considering finite metallization thickness and anisotropic substrate , 1991 .

[5]  Cam Nguyen,et al.  Broadside-coupled coplanar waveguides and their end-coupled band-pass filter applications , 1992 .

[6]  W. Heinrich,et al.  Quasi-TEM description of MMIC coplanar lines including conductor-loss effects , 1993 .

[7]  S. A. Ivanov,et al.  Determination of the Characteristic Impedance by a Step Current Density Approximation (Short Papers) , 1984 .

[8]  Reinhold Pregla,et al.  The method of lines for the analysis of planar waveguides with finite metallization thickness , 1990 .

[9]  R. Mittra,et al.  Higher order asymptotic boundary condition for the finite element modeling of two-dimensional transmission line structures , 1990 .

[10]  Raj Mittra,et al.  Quasi-TEM Analysis of Microwave Transmission Lines by the Finite-Element Method , 1986 .

[11]  E. Drake,et al.  Quasi‐tem analysis of thick multistrip lines using an efficient iterative method , 1992 .

[12]  Chung-Hsing Tan,et al.  Analysis of a shielded microstrip line with finite metallization thickness by the boundary element method , 1990 .

[13]  D. Marcuse Electrostatic field of coplanar lines computed with the point matching method , 1989 .

[14]  Giuseppe Macchiarella,et al.  Quasi-static analysis of shielded planar transmission lines with finite metallization thickness by a mixed spectral-space domain method , 1994 .