NTV 영역에서의 delay model과 parametric variation

NTV(Near-Threshold Voltage) region is distinguished by large delay values and variability of gate cells. In order to validate commercially available cell characterization methodologies, we perform an extensive evaluations on NLDM delay models of inverter cell on NTV regions and compare the effect of parametric variations over gate delay on NTV and nominal voltage regions, disclosing a need for NTV-aware variation modeling methodologies.