Evidence of relationship between strain and In-incorporation: Growth of N-polar In-rich InAlN buffer layer by OMCVD
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P. Ruterana | P. Šiffalovič | J. Kuzmík | F. Gucmann | S. Hasenöhrl | Martin Kuball | E. Dobročka | S. Kret | A. Minj | J. Kováč | M. Chauvat | Ľ. Vančo | Prerna Chauhan | P. Chauhan