Fault injection for verifying testability at the VHDL level

This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allows incorporation of both transient and permanent faults to varying levels of VHDL hierarchy, and helps in verifying the performance of a testable system.

[1]  Irith Pomeranz,et al.  A Low Power Pseudo-Random BIST Technique , 2003, J. Electron. Test..

[2]  Alexandre M. Amory,et al.  Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL , 2000, IOLTW.

[3]  Irith Pomeranz,et al.  A low power pseudo-random BIST technique , 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

[4]  Massimo Violante,et al.  Exploiting FPGA for accelerating fault injection experiments , 2001, Proceedings Seventh International On-Line Testing Workshop.

[5]  P. K. Lala Self-Checking and Fault-Tolerant Digital Design , 1995 .

[6]  Barry W. Johnson,et al.  Behavioral fault modeling in a VHDL synthesis environment , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

[7]  Barry W. Johnson,et al.  A Fault Injection Technique for VHDL Behavioral-Level Models , 1996, IEEE Des. Test Comput..

[8]  Massimo Violante,et al.  New techniques for accelerating fault injection in VHDL descriptions , 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

[9]  P. H. Eaton,et al.  SEU and SET Mitigation Techniques for FPGA Circuit and Configuration Bit Storage Design , 2005 .