Fault injection for verifying testability at the VHDL level
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[1] Irith Pomeranz,et al. A Low Power Pseudo-Random BIST Technique , 2003, J. Electron. Test..
[2] Alexandre M. Amory,et al. Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL , 2000, IOLTW.
[3] Irith Pomeranz,et al. A low power pseudo-random BIST technique , 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
[4] Massimo Violante,et al. Exploiting FPGA for accelerating fault injection experiments , 2001, Proceedings Seventh International On-Line Testing Workshop.
[5] P. K. Lala. Self-Checking and Fault-Tolerant Digital Design , 1995 .
[6] Barry W. Johnson,et al. Behavioral fault modeling in a VHDL synthesis environment , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
[7] Barry W. Johnson,et al. A Fault Injection Technique for VHDL Behavioral-Level Models , 1996, IEEE Des. Test Comput..
[8] Massimo Violante,et al. New techniques for accelerating fault injection in VHDL descriptions , 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).
[9] P. H. Eaton,et al. SEU and SET Mitigation Techniques for FPGA Circuit and Configuration Bit Storage Design , 2005 .