Electrochemical Processes for Formation, Processing and Gate Control of III-V Semiconductor Nanostructures

Abstract This paper reviews recent efforts by authors’ group to utilize electrochemical processes for formation, processing and gate control of III–V semiconductor nanostructures. Topics include precise photo-anodic and pulsed anodic etching of InP, formation of arrays of 〈0 0 1〉-oriented straight nanopores in n-type (0 0 1)InP by anodization and their possible applications and macroscopic and nanometer-scale metal contact formation on GaAs, InP and GaN by a pulsed in situ electrochemical process, which remarkably reduces Fermi level pinning. All the results indicate that electrochemical processes can achieve unique and important results, which the conventional semiconductor technology cannot realize, anticipating their increased importance in future semiconductor nanotechnology and nanoelectronics.

[1]  G. Su,et al.  Patterned arrays of porous InP from photolithography and electrochemical etching , 2003 .

[2]  K. Nishio,et al.  Fabrication of highly ordered anodic porous alumina using self-organized polystyrene particle array , 2004 .

[3]  Seiya Kasai,et al.  Current Transport and Capacitance-Voltage Characteristics of GaAs and InP Nanometer-Sized Schottky Contacts Formed by in situ Electrochemical Process , 2001 .

[4]  Hideki Hasegawa,et al.  Mechanism of anomalous current transport in n-type GaN Schottky contacts , 2002 .

[5]  Lester F. Eastman,et al.  pH response of GaN surfaces and its application for pH-sensitive field-effect transistors , 2003 .

[6]  Formation of Size- and Position-Controlled Nanometer Size Pt Dots on GaAs and InP Substrates by Pulsed Electrochemical Deposition , 1999 .

[7]  Guy Hollinger,et al.  On the nature of oxides on InP surfaces , 1985 .

[8]  F. Ross,et al.  The formation of porous GaAs in HF solutions , 1997 .

[9]  I. Lindau,et al.  New and unified model for Schottky barrier and III–V insulator interface states formation , 1979 .

[10]  E. Yu,et al.  Reverse-bias leakage current reduction in GaN Schottky diodes by electrochemical surface treatment - eScholarship , 2003 .

[11]  P. Searson,et al.  ELECTROCHEMICAL FORMATION OF GAAS/BI SCHOTTKY BARRIERS , 1999 .

[12]  Michael J. Uren,et al.  An experimental and theoretical study of the formation and microstructure of porous silicon , 1985 .

[13]  Effect of irradiant wavelength during porous silicon formation , 1997 .

[14]  K. Bachmann,et al.  Electrodissolution and passivation phenomena in III–V semiconducting compounds , 1983 .

[15]  Martin Moskovits,et al.  Highly-ordered carbon nanotube arrays for electronics applications , 1999 .

[16]  Anisotropic Refractive Index of Porous InP Fabricated by Anodization of (111)A Surface , 1995 .

[17]  Takashi Jimbo,et al.  Porous GaAs formed by a two-step anodization process , 1997 .

[18]  Eli Kapon,et al.  Molecular beam epitaxy of GaAs/AlGaAs superlattice heterostructures on nonplanar substrates , 1987 .

[19]  Evolution mechanism of nearly pinning-free platinum/n-type indium phosphide interface with a high Schottky barrier height by in situ electrochemical process , 1997 .

[20]  Masahiro Seo,et al.  Formation and corrosion of InP/In contacts in hydrochloric acid , 2000 .

[21]  T. Nakagawa,et al.  Control of structure and optical anisotropy in porous Si by magnetic‐field assisted anodization , 1996 .

[22]  S. Fujimoto,et al.  Morphological characterization of porous InP superlattices , 2004 .

[23]  S. Arai,et al.  Fabrication of 60 nm pitch ordered InP pillars by EB-lithography and anodization , 1995 .

[24]  John B. Shoven,et al.  I , Edinburgh Medical and Surgical Journal.

[25]  Y. Amemiya,et al.  Schottky Contacts on n-InP with High Barrier Heights and Reduced Fermi-Level Pinning by a Novel In Situ Electrochemical Process , 1995 .

[26]  I. Watanabe,et al.  547-GHz f/sub t/ In/sub 0.7/Ga/sub 0.3/As-In/sub 0.52/Al/sub 0.48/As HEMTs with reduced source and drain resistance , 2004, IEEE Electron Device Letters.

[27]  H. Hasegawa,et al.  Large Schottky Barrier Heights on Indium Phosphide-Based Materials Realized by In-Situ Electrochemical Process , 1997 .

[28]  G. G. Stokes "J." , 1890, The New Yale Book of Quotations.

[29]  Unpinning of Fermi level in nanometer-sized Schottky contacts on GaAs and InP , 2000 .

[30]  Panayotis C. Andricacos,et al.  Damascene copper electroplating for chip interconnections , 1998, IBM J. Res. Dev..

[31]  Andrew G. Glen,et al.  APPL , 2001 .

[32]  W. Jaegermann,et al.  Pulse plating of Pt on n-GaAs (100) wafer surfaces: Synchrotron induced photoelectron spectroscopy and XPS of wet fabrication processes , 2003 .

[33]  R. L. Smith,et al.  A theoretical model of the formation morphologies of porous silicon , 1988 .

[34]  T. Baba,et al.  Theoretical calculation of photonic gap in semiconductor 2-dimensional photonic crystals with various shapes of optical atoms , 1995 .

[35]  J. Tersoff Schottky Barrier Heights and the Continuum of Gap States , 1984 .

[36]  S. D. Collins,et al.  Porous silicon formation mechanisms , 1992 .

[37]  Photoluminescence of ozone oxidized and HF etched porous silicon and the multiple source quantum well model , 1997 .

[38]  Electrical Properties of Nanometer-Sized Schottky Contacts on n-GaAs and n-InP Formed by in Situ Electrochemical Process , 2000 .

[39]  C. M. Wolfe,et al.  An Improved Method for the Electrochemical C‐V Profiling of Indium Phosphide , 1986 .

[40]  Hideki Hasegawa,et al.  Molecular-Beam Epitaxy and Device Applications of III-V Semiconductor Nanowires , 1999 .

[41]  H. Hasegawa,et al.  X-ray photo-electron spectroscopy analysis of InP insulator-semiconductor structures prepared by anodic oxidation , 1990 .

[42]  H. Hasegawa,et al.  Anodic Oxidation of GaAs in Mixed Solutions of Glycol and Water , 1976 .

[43]  Hideki Hasegawa,et al.  Unified disorder induced gap state model for insulator–semiconductor and metal–semiconductor interfaces , 1986 .

[44]  S. Arai,et al.  Fabrication of Vertical and Uniform-Size Porous InP Structure by Electrochemical Anodization , 1994 .

[45]  David J. Lockwood,et al.  Visible photoluminescence from porous GaAs , 1996 .

[46]  Kestutis Grigoras,et al.  Morphology and strongly enhanced photoluminescence of porous GaAs layers made by anodic etching , 2002 .

[47]  H. Hasegawa,et al.  Properties of nanometer-sized metal–semiconductor interfaces of GaAs and InP formed by an in situ electrochemical process , 1999 .

[48]  Hideki Hasegawa,et al.  Formation of 〈001〉-aligned nano-scale pores on (001) n-InP surfaces by photoelectrochemical anodization in HCl , 1999 .

[49]  Hideki Hasegawa,et al.  Analysis and control of excess leakage currents in nitride-based Schottky diodes based on thin surface barrier model , 2004 .