On-Line Junction Temperature Monitoring of Switching Devices with Dynamic Compact Thermal Models Extracted with Model Order Reduction

Residual lifetime estimation has gained a key point among the techniques that improve the reliability and the efficiency of power converters. The main cause of failures are the junction temperature cycles exhibited by switching devices during their normal operation; therefore, reliable power converter lifetime estimation requires the knowledge of the junction temperature time profile. Since on-line dynamic temperature measurements are extremely difficult, in this work an innovative real-time monitoring strategy is proposed, which is capable of estimating the junction temperature profile from the measurement of the dissipated powers through an accurate and compact thermal model of the whole power module. The equations of this model can be easily implemented inside a FPGA, exploiting the control architecture already present in modern power converters. Experimental results on an IGBT power module demonstrate the reliability of the proposed method.

[1]  Vincenzo d'Alessandro,et al.  Accurate Maximum Power Tracking in Photovoltaic Systems Affected by Partial Shading , 2015 .

[2]  P. Guerriero,et al.  A wireless sensor network for the monitoring of large PV plants , 2014, 2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion.

[3]  Andrea Irace,et al.  Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations , 2013, Microelectron. Reliab..

[4]  P. Guerriero,et al.  On the design and the control of a coupled-inductors boost dc-ac converter for an individual PV panel , 2012, International Symposium on Power Electronics Power Electronics, Electrical Drives, Automation and Motion.

[5]  D. L. Blackburn,et al.  Simulating the dynamic electrothermal behavior of power electronic circuits and systems , 1993 .

[6]  Hui Huang,et al.  A Lifetime Estimation Technique for Voltage Source Inverters , 2013, IEEE Transactions on Power Electronics.

[7]  Ali Emadi,et al.  A Fast Electro-Thermal Model of Traction Inverters for Electrified Vehicles , 2017, IEEE Transactions on Power Electronics.

[8]  Frede Blaabjerg,et al.  Advanced Accelerated Power Cycling Test for Reliability Investigation of Power Device Modules , 2016, IEEE Transactions on Power Electronics.

[9]  M. Dessouky,et al.  A framework theory for Dynamic Compact Thermal Models , 2012, 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

[10]  V. Szekely,et al.  On the representation of infinite-length distributed RC one-ports , 1991 .

[11]  M.-N. Sabry,et al.  Dynamic Compact Thermal Models Used for Electronic Design: A Review of Recent Progress , 2003 .

[12]  Alessandro Magnani,et al.  Novel partition-based approach to dynamic compact thermal modeling , 2016, 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

[13]  Peter Tavner,et al.  Condition Monitoring for Device Reliability in Power Electronic Converters: A Review , 2010, IEEE Transactions on Power Electronics.

[14]  M. de Magistris,et al.  Time domain dynamic electrothermal macromodeling for thermally aware integrated system design , 2013, 2013 17th IEEE Workshop on Signal and Power Integrity.

[15]  V. d'Alessandro,et al.  SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs , 2014, 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

[16]  Vincenzo d'Alessandro,et al.  A power line communication on DC bus with photovoltaic strings , 2014 .

[17]  Dawei Xiang,et al.  An Industry-Based Survey of Reliability in Power Electronic Converters , 2011, IEEE Transactions on Industry Applications.

[18]  P. Guerriero,et al.  Thermal feedback blocks for fast and reliable electrothermal circuit simulation of power circuits at module level , 2016, 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD).

[19]  Vincenzo d'Alessandro,et al.  An automated high-granularity tool for a fast evaluation of the yield of PV plants accounting for shading effects , 2015 .

[20]  A. Irace,et al.  An ultrafast IR thermography system for transient temperature detection on electronic devices , 2014, 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

[21]  Vincenzo d'Alessandro,et al.  Fast Analytical Modeling of Dynamic Thermal Behavior of Semiconductor Devices and Circuits , 2014, IEEE Transactions on Electron Devices.

[22]  Alessandro Magnani,et al.  Fast novel thermal analysis simulation tool for integrated circuits (FANTASTIC) , 2014, 20th International Workshop on Thermal Investigations of ICs and Systems.

[23]  V. d'Alessandro,et al.  Novel MOR approach for extracting dynamic compact thermal models with massive numbers of heat sources , 2016, 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM).

[24]  R. Brook,et al.  Cumulative Damage in Fatigue: A Step towards Its Understanding , 1969 .

[25]  Diego Iannuzzi,et al.  An FPGA-Based Advanced Control Strategy of a Grid­Tied PV CHB Inverter , 2016, IEEE Transactions on Power Electronics.

[26]  Mariusz Zubert,et al.  Determination of average heat transfer coefficient value in compact thermal models , 2016, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

[27]  P. Guerriero,et al.  A PV AC-module based on coupled-inductors boost DC/AC converter , 2014, 2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion.

[28]  P. R. Gray,et al.  Computer simulation of integrated circuits in the presence of electrothermal interaction , 1976 .

[29]  Vincenzo d'Alessandro,et al.  Monitoring and Diagnostics of PV Plants by a Wireless Self-Powered Sensor for Individual Panels , 2016, IEEE Journal of Photovoltaics.

[30]  A Irace,et al.  An equivalent time temperature mapping system with a 320 x 256 pixels full-frame 100 kHz sampling rate. , 2007, The Review of scientific instruments.

[31]  Christopher Bailey,et al.  Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics , 2015, IEEE Transactions on Power Electronics.

[32]  Frederic Monsieur,et al.  Wafer level measurements and numerical analysis of self-heating phenomena in nano-scale SOI MOSFETs , 2016, Microelectron. Reliab..

[33]  Stig Munk-Nielsen,et al.  Improving Power Converter Reliability: Online Monitoring of High-Power IGBT Modules , 2014, IEEE Industrial Electronics Magazine.

[34]  Z. Khatir,et al.  Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions , 2003, Microelectron. J..

[35]  Paolo Maffezzoni,et al.  An Arnoldi based thermal network reduction method for electro-thermal analysis , 2003 .

[36]  S. Daliento,et al.  Approximate Closed-Form Analytical Solution for Minority Carrier Transport in Opaque Heavily Doped Regions Under Illuminated Conditions , 2006, IEEE Transactions on Electron Devices.

[37]  Stig Munk-Nielsen,et al.  A real time measurement of junction temperature variation in high power IGBT modules for wind power converter application , 2014 .

[38]  V. Szekely,et al.  Identification of RC networks by deconvolution: chances and limits , 1998 .

[39]  Clemens J. M. Lasance,et al.  Ten Years of Boundary-Condition- Independent Compact Thermal Modeling of Electronic Parts: A Review , 2008 .

[40]  C Mark Johnson,et al.  Real-Time Compact Thermal Models for Health Management of Power Electronics , 2010, IEEE Transactions on Power Electronics.

[41]  Ewan Macarthur,et al.  Accelerated Testing: Statistical Models, Test Plans, and Data Analysis , 1990 .

[42]  E.A. Herr,et al.  Reliability Evaluation and Prediction for Discrete Semiconductors , 1980, IEEE Transactions on Reliability.

[43]  P. Guerriero,et al.  Dynamic electrothermal simulation of photovoltaic plants , 2015, 2015 International Conference on Clean Electrical Power (ICCEP).

[44]  Alessandro Magnani,et al.  Dynamic Electrothermal Macromodeling: an Application to Signal Integrity Analysis in Highly Integrated Electronic Systems , 2013, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[45]  Niccolò Rinaldi,et al.  On the modeling of the transient thermal behavior of semiconductor devices , 2001 .

[46]  Mauro Ciappa,et al.  Selected failure mechanisms of modern power modules , 2002, Microelectron. Reliab..

[47]  V. d'Alessandro,et al.  Time domain identification of passive multiport RC networks with convex optimization: An application to thermal impedance macromodeling , 2014, 2014 IEEE 18th Workshop on Signal and Power Integrity (SPI).

[48]  Z. Bencic,et al.  Identification Of Thermal Equivalent - Circuit Parameters For Semiconductors , 1990, [Proceedings] 1990 IEEE Workshop on Computers in Power Electronics.

[49]  P. Guerriero,et al.  Single-Panel Voltage Zeroing System for Safe Access on PV Plants , 2015, IEEE Journal of Photovoltaics.