Scanning Tunneling Microscopy

This paper begins with a brief introduction the development of scanning tunneling microscopy (STM); in the second part, we will present some basic theory about STM, we will pay more attention on the theory for tunneling between the surfaces of the sample with the model probe tip. Next, we introduce the STM facility, include different modes of operation and other influence factors. In addition, some application of STM to nanofabrication and Nanocharacterization are reviewed. Finally, conclusion and outlook are made towards the future research on STM.