Study of Subharmonically Injection-Locked PLLs

A complete analysis on subharmonically injection-locked PLLs develops fundamental theory for subharmonic locking phenomenon. It explains the noise shaping phenomenon, locking range and behavior, PVT tolerance, and pseudo locking issue. All of the analyses are verified by real chip measurements. Two 20-GHz PLLs based on the proposed theory are designed and fabricated in 90-nm CMOS technology to demonstrate the superiority and robustness of this technique. The first chip aims at low-noise/low-power/high-divide-ratio design, achieving 149-fs rms jitter (integrated from 100 Hz to 1 GHz) while consuming 38 mW from a 1.3-V supply. The second prototype shoots for the lowest noise performance, presenting 85-fs rms jitter (the same integration interval) with a power dissipation of 105 mW. The jitter generation (from 50 kHz to 80 MHz) measures 48 fs, which is at least twice as small as that of any other known circuits.

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