New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters

This paper presents new methods for determination of differential nonlinearity (DNL) and effective resolution also known as Effective Bits (EB) of an A/D converter. DNL is determined by deviation of histogram of test ADC from histogram of ideal ADC generated through software. Modifications are applied in the standard histogram approach for more accurate estimation of Integral nonlinearity (INL). Combination of histogram and least square error minimization techniques is used for determination of EB of an A/D converter. Computer simulations show that proposed methods give better results as compared to the histogram method. Limitations of standard histogram technique for determination of these parameters are also reported. Effects of uncertainties of slope and intercept of best fit transfer characteristics of the ADC on EB are also analyzed.

[1]  Yih-Chyun Jenq,et al.  Measuring harmonic distortion and noise floor of an A/D converter using spectral averaging , 1988 .

[2]  M. F. Wagdy,et al.  Determining ADC effective number of bits via histogram testing , 1991 .

[3]  Ryszard A. Malewski,et al.  Measuring Properties of Fast Digitizers Employed for Recording HV Impulses , 1983, IEEE Transactions on Instrumentation and Measurement.

[4]  Klaus Schon,et al.  Digitization errors of fast digital recorders , 1987, IEEE Transactions on Instrumentation and Measurement.

[5]  Yih-Chyun Jenq,et al.  Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement , 1988 .

[6]  Bruce E. Peetz.  Dynamic Testing of Waveform Recorders , 1983, IEEE Transactions on Instrumentation and Measurement.

[7]  J. Blair.  Histogram measurement of ADC nonlinearities using sine waves , 1994 .

[8]  J. Kuffel,et al.  A comparative evaluation of some practical algorithms used in the equivalent bits test of waveform recorders , 1988 .

[9]  Y.-C. Jenq.  High-precision sinusoidal frequency estimator based on weighted least square method , 1987, IEEE Transactions on Instrumentation and Measurement.

[10]  M. F. Wagdy,et al.  Effect of sampling jitter on some sine wave measurements , 1989 .

[11]  Ryszard Malewski,et al.  Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave , 1987, IEEE Transactions on Instrumentation and Measurement.

[12]  J. A. McClean,et al.  FFT performance testing of data acquisition systems , 1986, IEEE Transactions on Instrumentation and Measurement.

[13]  Thomas E. Linnenbrink.  Effective Bits: Is That All There Is? , 1984, IEEE Transactions on Instrumentation and Measurement.