论文信息 - Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0) - 字舞流文

Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)

M. Carazzolle | R. Landers | S. Dreiner | U. Berges | C. Westphal | C. R. Flüchter | D. Weier | A. Siervo | G. Kleiman | M. Schürmann | A. Pancotti