Study of Nanoparticles at UTSA: One year of using the first JEM-ARM200F installed in USA

The University of Texas at San Antonio organized recently an Electron Microscopy core facility named the "Kleberg Advanced Microscopy Facility". The most relevant instrument is a JEOL JEM-ARM200F (with FEG) with probe aberration correction; this instrument was the first one installed outside Japan and is operational since February 2010. In this paper we report some of the results after one year of its operation.

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