Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy
暂无分享,去创建一个
E. Bourhis | T. Sui | A. Korsunsky | I. Dolbnya | E. Salvati | Hongjia Zhang | S. Ying | L. R. Brandt | C. Papadaki