论文信息 - Hard and soft-breakdown characteristics of ultra-thin HfO/sub 2/ under dynamic and constant voltage stress - 字舞流文

Hard and soft-breakdown characteristics of ultra-thin HfO/sub 2/ under dynamic and constant voltage stress

K. Onishi | S. Krishnan | R. Choi | Y.H. Kim | H. Cho | J.C. Lee | R. Nieh | C. Kang | J. Han | A. Shahriar