Defects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interface
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H. Yoshikawa | M. Sumiya | N. Ohashi | S. Ueda | Keisuke L. I. Kobayashi | Jianyong Li | Y. Yamashita | H. Haneda | I. Sakaguchi | Yutaka Adachi | Baoe Li | H. Okushi | Shoichi Senju | Y. Adachi