A framework for finding minimal test vectors for stuck-at-faults
暂无分享,去创建一个
[1] Xiaoqing Wen,et al. VLSI Test Principles and Architectures , 2006 .
[2] SAEED SHAMSHIRI,et al. Instruction-level test methodology for CPU core self-testing , 2005, TODE.
[3] Xiaoqing Wen,et al. VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) , 2006 .
[4] C. P. Ravikumar,et al. Test Strategies for Low Power Devices , 2008, 2008 Design, Automation and Test in Europe.
[5] Massimo Violante,et al. Automatic generation of validation stimuli for application-specific processors , 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.
[6] Giovanni Squillero,et al. New evolutionary techniques for test-program generation for complex microprocessor cores , 2005, GECCO '05.
[7] Irith Pomeranz,et al. Test vector chains for increased targeted and untargeted fault coverage , 2008, 2008 Asia and South Pacific Design Automation Conference.
[8] I.G. Harris,et al. An efficient control-oriented coverage metric , 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..
[9] John P. Hayes,et al. Probabilistic transfer matrices in symbolic reliability analysis of logic circuits , 2008, TODE.
[10] Vishwani D. Agrawal,et al. Test Generation for MOS Circuits Using D-Algorithm , 1983, 20th Design Automation Conference Proceedings.
[11] Franz Wotawa,et al. Error traces in model-based debugging of hardware description languages , 2005, AADEBUG'05.
[12] Fabio Somenzi,et al. Logic synthesis and verification algorithms , 1996 .