Inversion of dynamical electron scattering to obtain the crystal potential using data from two thicknesses.
暂无分享,去创建一个
[1] H. Faulkner,et al. Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy. , 2001, Ultramicroscopy.
[2] Faulkner,et al. Inversion of dynamical electron diffraction data including absorption , 2000, Acta crystallographica. Section A, Foundations of crystallography.
[3] Rez. Schemes to determine the crystal potential under dynamical conditions using voltage variation. , 1999, Acta crystallographica. Section A, Foundations of crystallography.
[4] Allen,et al. Retrieval of the projected potential by inversion from the scattering matrix in electron-crystal scattering. , 1999, Acta crystallographica. Section A, Foundations of crystallography.
[5] L. Allen,et al. Obtaining the Crystal Potential by Inversion from Electron Scattering Intensities , 1998 .
[6] David J Smith,et al. The realization of atomic resolution with the electron microscope , 1997 .
[7] Fu-Rong Chen,et al. Improvement of resolution by maximum entropy linear image restoration for NiSi2/Si interface , 1999 .
[8] David B. Williams,et al. Transmission Electron Microscopy: A Textbook for Materials Science , 1996 .
[9] David B. Williams,et al. Transmission Electron Microscopy , 1996 .