Enhanced spin polarization of amorphous FexSi1−x thin films revealed by Andreev reflection spectroscopy
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F. Hellman | Tingyong Chen | R. Wu | Jiaping Zhang | Y. Zhang | J. Karel | Gejian Zhao | Dongrin Kim | J. Gifford | D. S. Bouma | B. C. Li | Z. Y. Huang | J. Martinez