TEM cell measurements of an active EMC test chip

A TEM cell configuration is used to measure the emission effect of an active EMC test chip or of tracks connected to it. A number of parameters have a clear influence on the emission level: clock frequency, inverting 50% of the lines and, to a less extent, giving a relative delay to some lines (staggering). Varying the internal buffers shows the importance of simultaneous switching noise. The track emission is mainly due to H-field coupling, while the chip emission is due to both E- and H-field coupling. The above conclusions are in line with previous direct radiation measurement results.

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