An application of genetic algorithms and BDDs to functional testing

This paper describes a functional level rest pattern generator, which combines two techniques: genetic algorithms (GAs) and binary decision diagrams (BDDs). The combined execution of such two techniques achieves better results for functional testing, than the single application of each separated technique. The entire set of functional errors is examined in a shorter time and a more compact test set is produced. The reason of this interesting result has been analyzed in the paper. It mainly depends on the fact that hard to detect errors for GA-based testing techniques are easy to detect than errors for BDD-based techniques and vice versa. The two testing approaches are thus complementary and can effectively cooperate.

[1]  Fabrizio Ferrandi,et al.  Testability alternatives exploration through functional testing , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[2]  D. E. Goldberg,et al.  Genetic Algorithms in Search , 1989 .

[3]  Sumit Ghosh,et al.  On behavior fault modeling for digital designs , 1991, J. Electron. Test..

[4]  David E. Goldberg,et al.  Genetic Algorithms in Search Optimization and Machine Learning , 1988 .

[5]  Irith Pomeranz,et al.  On static compaction of test sequences for synchronous sequential circuits , 1996, DAC '96.

[6]  Elizabeth M. Rudnick,et al.  Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation , 1995, 32nd Design Automation Conference.

[7]  Elizabeth M. Rudnick,et al.  A genetic algorithm framework for test generation , 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[8]  J. R. Armstrong,et al.  Hierarchical test generation for VHDL behavioral models , 1993, 1993 European Conference on Design Automation with the European Event in ASIC Design.

[9]  G. Harik.  Linkage Learning via Probabilistic Modeling in the ECGA , 1999 .

[10]  Zbigniew Michalewicz,et al.  Genetic Algorithms + Data Structures = Evolution Programs , 1992, Artificial Intelligence.

[11]  Fernando G. Lobo,et al.  Linkage Learning Genetic Algorithm in C , 1998 .

[12]  Zbigniew Michalewicz,et al.  Genetic Algorithms + Data Structures = Evolution Programs , 1996, Springer Berlin Heidelberg.

[13]  Daniel G. Saab,et al.  Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms , 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[14]  Fabrizio Ferrandi,et al.  Symbolic functional vector generation for VHDL specifications , 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).

[15]  Paolo Prinetto,et al.  GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits , 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[16]  Michael S. Hsiao,et al.  Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG , 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[17]  Paolo Prinetto,et al.  Testability analysis and ATPG on behavioral RT-level VHDL , 1997, Proceedings International Test Conference 1997.

[18]  Michael S. Hsiao,et al.  Alternating strategies for sequential circuit ATPG , 1996, Proceedings ED&TC European Design and Test Conference.

[19]  Daniel G. Saab,et al.  Iterative simulation-based Genetics + Deterministic Techniques = Complete AtPG , 1994, IEEE/ACM International Conference on Computer-Aided Design.

[20]  Fabrizio Ferrandi,et al.  Implicit test generation for behavioral VHDL models , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).