No fault found, Retest ok, Cannot duplicate or fault not found? Towards a standardised taxonomy
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[1] Larry V. Kirkland. Why did we add LabVIEW applications to our ATLAS TPSs? , 2011, 2011 IEEE AUTOTESTCON.
[2] John W. Sheppard,et al. Analysis of false alarms during system design , 1992, Proceedings of the IEEE 1992 National Aerospace and Electronics Conference@m_NAECON 1992.
[3] Jeff Jones,et al. Investigation of the occurrence of: no-faults-found in electronic equipment , 2001, IEEE Trans. Reliab..
[4] Peter Söderholm. A system view of the No Fault Found (NFF) phenomenon , 2007, Reliab. Eng. Syst. Saf..
[5] J.K. Line,et al. Managing and Predicting Intermittent Failures Within Long Life Electronics , 2008, 2008 IEEE Aerospace Conference.
[6] Shaomin Wu,et al. Warranty claim analysis considering human factors , 2011, Reliab. Eng. Syst. Saf..
[7] Michael Pecht,et al. Environment and Usage Monitoringof Electronic Products for Health Assessment and Product Design , 2007 .
[8] Leonardo Mariani,et al. Dynamic Analysis for Diagnosing Integration Faults , 2011, IEEE Transactions on Software Engineering.
[9] L.Y. Ungar,et al. Unraveling the Cannot Duplicate and Retest OK problems by utilizing physics in testing and diagnoses , 2008, 2008 IEEE AUTOTESTCON.
[10] Paul Phillips,et al. Perspectives on the commercial development of landing gear health monitoring systems , 2011 .
[11] William R Simpson,et al. Predictors of Organizational-Level Testability Attributes , 1987 .
[12] Michael G. Pecht,et al. No-fault-found and intermittent failures in electronic products , 2008, Microelectron. Reliab..
[13] Michael Pecht,et al. Evaluation of built-in test , 2001 .