No fault found, Retest ok, Cannot duplicate or fault not found? Towards a standardised taxonomy

There is a phenomenon which exists in complex engineered systems, most notably those which are electrical or electronic which is the inability to diagnose faults reported during operation. This includes difficulties in detecting the same reported symptoms with standard testing, the inability to correctly localise the suspected fault and the failure to diagnose the problem which has resulted in maintenance work. However an inconsistent terminology is used in connection with this phenomenon within both scientific communities and industry. It has become evident that ambiguity, misuse and misunderstanding have directly compounded the issue. The purpose of this paper is to work towards standardisation of the taxonomy surrounding the phenomena popularly termed No Fault Found, Retest Okay, Cannot Duplicate or Fault Not Found amongst many others. This includes discussion on how consistent terminology is essential to the experts within organisation committees and, to the larger group of users, who do not have specialised knowledge of the field.

[1]  Larry V. Kirkland Why did we add LabVIEW applications to our ATLAS TPSs? , 2011, 2011 IEEE AUTOTESTCON.

[2]  John W. Sheppard,et al.  Analysis of false alarms during system design , 1992, Proceedings of the IEEE 1992 National Aerospace and Electronics Conference@m_NAECON 1992.

[3]  Jeff Jones,et al.  Investigation of the occurrence of: no-faults-found in electronic equipment , 2001, IEEE Trans. Reliab..

[4]  Peter Söderholm A system view of the No Fault Found (NFF) phenomenon , 2007, Reliab. Eng. Syst. Saf..

[5]  J.K. Line,et al.  Managing and Predicting Intermittent Failures Within Long Life Electronics , 2008, 2008 IEEE Aerospace Conference.

[6]  Shaomin Wu,et al.  Warranty claim analysis considering human factors , 2011, Reliab. Eng. Syst. Saf..

[7]  Michael Pecht,et al.  Environment and Usage Monitoringof Electronic Products for Health Assessment and Product Design , 2007 .

[8]  Leonardo Mariani,et al.  Dynamic Analysis for Diagnosing Integration Faults , 2011, IEEE Transactions on Software Engineering.

[9]  L.Y. Ungar,et al.  Unraveling the Cannot Duplicate and Retest OK problems by utilizing physics in testing and diagnoses , 2008, 2008 IEEE AUTOTESTCON.

[10]  Paul Phillips,et al.  Perspectives on the commercial development of landing gear health monitoring systems , 2011 .

[11]  William R Simpson,et al.  Predictors of Organizational-Level Testability Attributes , 1987 .

[12]  Michael G. Pecht,et al.  No-fault-found and intermittent failures in electronic products , 2008, Microelectron. Reliab..

[13]  Michael Pecht,et al.  Evaluation of built-in test , 2001 .