An Evaluation of I/sub DDQ/ Versus Conventional Testing for CMOS Sea-of-Gate IC's

fDDQ production testing technologies have been developed for 0.8 pm CMOS Sea-of-gate IC's (SOG). Over 400 samples were measured, and the results of conventional testing and IDDQ testing were compared. IDDQ tcsting proved to have high fault coverage and very effective for testing CMOS VLSIs such as SOG.

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