Differential Resistance Testing for InP-Based Semiconductor Optical Amplifiers

A new method for electrically measuring optical performance degradation in InP-based semiconductor optical amplifiers (SOAs) is presented. It is shown that this degradation can be directly qualified through measurements of electrical subthreshold differential resistance. Experimental measurements are presented along with a theoretical analysis to demonstrate a proposed aging signature. Furthermore, two system designs are presented based on using this signature for enhancing device testability.

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