Lifetime prediction of self-lubricating spherical plain bearings based on physics-of-failure model and accelerated degradation test
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Jinzhong Lu | Yashun Wang | Xin Fang | Xun Chen | Chunhua Zhang | Xun Chen | Yashun Wang | X. Fang | Chunhua Zhang | Jinzhong Lu
[1] Jing-Rui Zhang,et al. Optimization of step stress accelerated degradation test plans , 2010, 2010 IEEE 17Th International Conference on Industrial Engineering and Engineering Management.
[2] B. Yum,et al. Optimal Design of Step-stress Degradation Tests in the Case of Destructive Measurement , 2008 .
[3] Shing I. Chang,et al. Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes , 2016, IEEE Transactions on Reliability.
[4] Yuanyuan Tan,et al. A new universal approximate model for conformal contact and non-conformal contact of spherical surfaces , 2015 .
[5] Shizhu Wen,et al. Principles of Tribology , 2011 .
[6] Hong-Fwu Yu,et al. Designing an accelerated degradation experiment by optimizing the estimation of the percentile , 2003 .
[7] Luis A. Escobar,et al. Accelerated degradation tests: modeling and analysis , 1998 .
[8] Alessandro Paccagnella,et al. Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMTs submitted to accelerated life tests , 1998 .
[9] Xiang Lu,et al. Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing , 2015, Reliab. Eng. Syst. Saf..
[10] I. Polavarapu,et al. An interval estimate of mean-time-to-failure for a product with reciprocal Weibull degradation failure rate , 2005, Annual Reliability and Maintainability Symposium, 2005. Proceedings..
[11] C. Joseph Lu,et al. Using Degradation Measures to Estimate a Time-to-Failure Distribution , 1993 .
[12] Yuanyuan Tan,et al. Newly developed theoretical solution and numerical model for conformal contact pressure distribution and free-edge effect in spherical plain bearings , 2015 .
[13] Ewan Macarthur,et al. Accelerated Testing: Statistical Models, Test Plans, and Data Analysis , 1990 .
[14] Sheng-Tsaing Tseng,et al. Optimal design for step-stress accelerated degradation tests , 2006, IEEE Trans. Reliab..
[15] Heonsang Lim. Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost , 2015, Entropy.
[16] Y. Wang,et al. Lifetime prediction method for electron multiplier based on accelerated degradation test , 2014 .
[17] Loon Ching Tang,et al. Accelerated Degradation Test Planning Using the Inverse Gaussian Process , 2014, IEEE Transactions on Reliability.
[18] W. Meeker. Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .
[19] Michael J. LuValle. An approximate kinetic theory for accelerated testing , 1999 .
[20] M. Boulanger,et al. Experimental Design for a Class of Accelerated Degradation Tests , 1994 .
[21] Hong-Fwu Yu,et al. DESIGNING AN ACCELERATED DEGRADATION EXPERIMENT BY OPTIMIZING THE INTERVAL ESTIMATION OF THE MEAN-TIME-TO-FAILURE , 2002 .
[22] Bong-Jin Yum,et al. Optimal Design of Step-Stress Degradation Tests in the Case of Destructive Measurement , 2004 .
[23] Jen Tang,et al. Optimum step-stress accelerated degradation test for Wiener degradation process under constraints , 2015, Eur. J. Oper. Res..
[24] Kai Yang,et al. Accelerated degradation-tests with tightened critical values , 2002, IEEE Trans. Reliab..
[25] Tongmin Jiang,et al. Optimal design for step-stress accelerated degradation testing based on D-optimality , 2011, 2011 Proceedings - Annual Reliability and Maintainability Symposium.
[26] E. Rabinowicz,et al. Friction and Wear of Self-Lubricating Metallic Materials , 1975 .
[27] Hong-Fwu Yu,et al. Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate , 2006 .
[28] Tzong-Ru Tsai,et al. Optimal Decisions on the Accelerated Degradation Test Plan Under the Wiener Process , 2014 .
[29] M. Xie,et al. Planning of step-stress accelerated degradation test , 2004, Annual Symposium Reliability and Maintainability, 2004 - RAMS.