The refractive index dispersion of Hg1−xCdxTe by infrared spectroscopic ellipsometry
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[1] D. Aspnes,et al. Nondestructive analysis of Hg1−xCdxTe (x=0.00, 0.20, 0.29, and 1.00) by spectroscopic ellipsometry. II. Substrate, oxide, and interface properties , 1984 .
[2] Yael Nemirovsky,et al. Infrared optical absorption of Hg1−xCdxTe , 1979 .
[3] E. Finkman,et al. The exponential optical absorption band tail of Hg1−xCdxTe , 1984 .
[4] Kun Liu,et al. Empirical rule of intrinsic absorption spectroscopy in Hg1−xCdxTe , 1994 .
[5] Chuan Yi Tang,et al. A 2.|E|-Bit Distributed Algorithm for the Directed Euler Trail Problem , 1993, Inf. Process. Lett..
[6] M. Cardona,et al. Ellipsometric studies of electronic interband transitions in Cd x Hg 1-x Te , 1984 .
[7] Junhao Chu,et al. Energy gap versus alloy composition and temperature in Hg1−xCdxTe , 1983 .
[8] Kun Liu,et al. Composition and temperature dependence of the refractive index in Hg1−xCdxTe , 1994 .
[9] Junhao Chu,et al. Band‐to‐band optical absorption in narrow‐gap Hg1−xCdxTe semiconductors , 1992 .
[10] Z. Kučera. Dispersion of the refractive index of Hg1–xCdxTe , 1987 .
[11] B. Jensen,et al. Linear and nonlinear intensity dependent refractive index of Hg1−xCdxTe , 1983 .
[12] D. Aspnes. Optimizing precision of rotating-analyzer ellipsometers , 1974 .