Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification
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Rong-Seng Chang | Jang-Zern Tsai | Tung-Yen Li | Li-Wei Ho | Ching-Fu Yang | J. Tsai | R. Chang | Tung-Yen Li | L. Ho | Ching-Fu Yang
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