A generalized equation is derived that represents relations between properties of a device under test and an indication of a measuring instrument having signal generators and an input port. The equation can be applied to most narrow-band radiometers or reflection-measuring instruments. Considering only factors measured outside the instrument, the equation permits exact measurements of properties of the device under test or easier evaluation of errors in the measurements without any consideration of structures or inner properties of the instrument. In addition, according to this concept, a new method permitting direct measurements of mismatch factors or delivered powers and a possibility of a radiometer to be used for reflection measurements are suggested.
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