Machine Learning on the Thermal Side-Channel: Analysis of Accelerator-Rich Architectures

The thermal profiles of integrated circuits (ICs) have been leveraged as a side-channel in multiple circuit and architectural scenarios. Applications range from identifying hardware Trojans to estimating the per-core power consumption of homogeneous multicore processors. Such scenarios leverage the correlation between the on-chip location of the consumed power with some target information of interest, such as correlating the extra power consumption at a specific circuit position with the presence of a hardware Trojan. While the spatial correlation between the power consumption and thermal profiles applies to all ICs, there is a fundamental difference in the context of modern SoCs. The difference stems from the presence of hardware accelerators, in which localized power consumption corresponds to the system performing the specific task that a given accelerator executes. The work described in the paper demonstrates the implications of correlating the thermal and power profiles of SoCs by presenting two working case studies that determine, at runtime, 1) the activity factor of each accelerator and 2) whether or not a system is infected by malware. This work relies on pre-processing thermal images in order to obtain a spatial profile of the estimated power density and uses a modified version of a previously developed technique that is tailored for use with accelerator-rich ICs. The resulting power estimates are fed into machine learning models that predict the core activity factor with mean average errors between 3% and 5% for the highest performing core. The statistical models used for malware detection result in an AuROC score of up to 1.0 and 0.9 when the malware offsets the activity factor of a single core by 2.5% and the 3-sigma width of the workload activity factor distribution is 2.5% and 5%, respectively.

[1]  Farinaz Koushanfar,et al.  High-sensitivity hardware Trojan detection using multimodal characterization , 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[2]  Wei Hu,et al.  Quantifying timing-based information flow in cryptographic hardware , 2015, 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

[3]  VARUN CHANDOLA,et al.  Anomaly detection: A survey , 2009, CSUR.

[4]  Michael Hutter,et al.  The Temperature Side Channel and Heating Fault Attacks , 2013, CARDIS.

[5]  Milos Prvulovic,et al.  EDDIE: EM-based detection of deviations in program execution , 2017, 2017 ACM/IEEE 44th Annual International Symposium on Computer Architecture (ISCA).

[6]  Yusuf Leblebici,et al.  Analysis and Optimization of MPSoC Reliability , 2006, J. Low Power Electron..

[7]  David Naccache,et al.  Thermocommunication , 2009, IACR Cryptol. ePrint Arch..

[8]  Sherief Reda,et al.  Blind identification of power sources in processors , 2017, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.

[9]  Sherief Reda,et al.  Blind Identification of Thermal Models and Power Sources From Thermal Measurements , 2018, IEEE Sensors Journal.

[10]  Taewhan Kim,et al.  Hotspots Elimination and Temperature Flattening in VLSI Circuits , 2008, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[11]  Yury Gogotsi,et al.  Electromagnetic interference shielding with 2D transition metal carbides (MXenes) , 2016, Science.

[12]  Sanu Mathew,et al.  Improved power side channel attack resistance of a 128-bit AES engine with random fast voltage dithering , 2017, ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference.

[13]  Srdjan Capkun,et al.  Thermal Covert Channels on Multi-core Platforms , 2015, USENIX Security Symposium.

[14]  Daniel Nikovski,et al.  Regularized covariance matrix estimation with high dimensional data for supervised anomaly detection problems , 2016, 2016 International Joint Conference on Neural Networks (IJCNN).

[15]  D. Donoho,et al.  Sparse MRI: The application of compressed sensing for rapid MR imaging , 2007, Magnetic resonance in medicine.

[16]  Christof Paar,et al.  SCANDALee: A side-ChANnel-based DisAssembLer using local electromagnetic emanations , 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[17]  Karthikeyan Sankaralingam,et al.  Dark Silicon and the End of Multicore Scaling , 2012, IEEE Micro.

[18]  Sherief Reda,et al.  Post-silicon power characterization using thermal infrared emissions , 2010, 2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED).