Pt-doped Ni-silicide films formed by pulsed-laser annealing: Microstructural evolution and thermally robust Ni1-xPtxSi2 formation
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Hyoungsub Kim | Ilgyou Shin | Tae-Gon Kim | Hoo-Jeong Lee | Sungho Lee | Hyung‐Ik Lee | Y. H. Kim | Ki-Hyun Hwang | J. Won | Taejin Park | Jinbum Kim | Seongheum Choi | Jinyong Kim | S. Hong | Hyungik Lee