Test and debug strategy of the PNX8525 Nexperia/sup TM/ digital video platform system chip
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[1] Bart Vermeulen,et al. Silicon debug: scan chains alone are not enough , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[2] Renu Raman,et al. MicroSPARC: a case-study of scan based debug , 1994, Proceedings., International Test Conference.
[3] Yervant Zorian,et al. Testing Embedded-Core-Based System Chips , 1999, Computer.
[4] Hong Hao,et al. Structured design-for-debug-the SuperSPARC II methodology and implementation , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[5] M. Lousberg,et al. The role of test protocols in testing embedded-core-based system ICs , 1999, European Test Workshop 1999 (Cat. No.PR00390).
[6] Bart Vermeulen,et al. Silicon debug of a co-processor array for video applications , 2000, Proceedings IEEE International High-Level Design Validation and Test Workshop (Cat. No.PR00786).
[7] R. G. Bennetts,et al. Testability Concepts for Digital ICs: The Macro Test Approach , 1995 .
[8] Jos van Beers,et al. Test features of a core-based co-processor array for video applications , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[9] Sridhar Narayanan,et al. Testability, debuggability, and manufacturability features of the UltraSPARC-I microprocessor , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[10] Ben Bennetts,et al. Macro Testability; The Results of Production Device Applications , 1992, Proceedings International Test Conference 1992.
[11] F.P.M. Beenker,et al. Macro Testing: Unifying IC And Board Test , 1986, IEEE Design & Test of Computers.
[12] Rodham E. Tulloss,et al. The Test Access Port and Boundary Scan Architecture , 1990 .
[13] Phil Nigh. What defects escape our tests ... and how will we detect them in the future , 2000 .
[14] Erik Jan Marinissen,et al. A structured and scalable mechanism for test access to embedded reusable cores , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[15] Yervant Zorian,et al. Challenges in testing core-based system ICs , 1999, IEEE Commun. Mag..