Buffer Traps in Fe-Doped AlGaN/GaN HEMTs: Investigation of the Physical Properties Based on Pulsed and Transient Measurements
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Claudio Lanzieri | Gaudenzio Meneghesso | Enrico Zanoni | Matteo Meneghini | Alessio Pantellini | Isabella Rossetto | Alessandro Chini | Davide Bisi | Antonio Stocco | M. Meneghini | G. Meneghesso | A. Chini | C. Lanzieri | E. Zanoni | D. Bisi | A. Stocco | I. Rossetto | A. Nanni | A. Pantellini | Antonio Nanni
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