Influence of Surface Recombination on Forward Current–Voltage Characteristics of Mesa GaN $\hbox{p}^{+}\hbox{n}$ Diodes Formed on GaN Free-Standing Substrates
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T. Mishima | T. Nakamura | R. Tsuchiya | T. Ishigaki | T. Tsuchiya | K. Mochizuki | K. Nomoto | A. Terano | Y. Hatakeyama | H. Katayose | N. Kaneda