SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs
暂无分享,去创建一个
E.G. Stassinopoulos | K. LaBel | G.J. Brucker | C.A. Stauffer | K. Label | E. Stassinopoulos | C. Stauffer | G. Brucker
[1] Kenneth A. LaBel,et al. Transient SEUs in a fiber optic system for space applications , 1991 .
[2] James C. Pickel,et al. Heavy Ion Induced Permanent Damage in MNOS Gate Insulators , 1985, IEEE Transactions on Nuclear Science.