Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results.

[1]  H. R. Schwartz,et al.  Heavy ion and proton induced single event transients in comparators , 1996 .

[2]  D. Hughart,et al.  Low Dose Rate Test Results of National Semiconductor's ELDRS-free Bipolar Amplifier LM124 and Comparators LM139 and LM193 , 2008, 2008 IEEE Radiation Effects Data Workshop.

[3]  Stephen LaLumondiere,et al.  Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions , 1997 .

[4]  E. Petersen.  Single-Event Data Analysis , 2008, IEEE Transactions on Nuclear Science.

[5]  F. Ashcroft,et al.  VIII. References , 1955 .

[6]  Ken LaBel,et al.  Testing Guidelines for Single Event Transient (SET) Testing of Linear Devices , 2003 .

[7]  R. Koga,et al.  Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators , 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

[8]  S. Crain,et al.  Variability in measured SEE sensitivity associated with design and fabrication iterations , 2003, 2003 IEEE Radiation Effects Data Workshop.

[9]  M. Galloway,et al.  "Super" cocktails for heavy ion testing , 2007, 2007 IEEE Radiation Effects Data Workshop.

[10]  Dale McMorrow,et al.  Single Event Transients in Linear Integrated Circuits , 2005 .

[11]  Stephen LaLumondiere,et al.  Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators , 2002 .

[12]  peixiong zhao,et al.  Critical charge for single-event transients (SETs) in bipolar linear circuits , 2001 .

[13]  S. Buchner,et al.  Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies , 1994 .

[14]  C. Poivey,et al.  Pulsed-laser testing methodology for single event transients in linear devices , 2004, IEEE Transactions on Nuclear Science.