Criterion for optimal image resolution using SIFT

Image processing is used to check products in many factories. If we use down-sampled images, we can reduce the calculation time and the image noise. However, the accuracy of the detection also becomes low. The purpose of this article is to estimate the optimal image resolution for detection while keeping the accuracy of detection high. To achieve our purpose, we adopt the scale invariant feature transform (SIFT) as the criterion of the optimal image resolution. Finally, we confirm that our proposed method is useful with a simulation.