论文信息 - Interfacial layer observed by ellipsometry in MOCVD grown Pb(Zr, Ti)O3 thin films - 字舞流文

Interfacial layer observed by ellipsometry in MOCVD grown Pb(Zr, Ti)O3 thin films

E. Haverkamp | P. Larsen | N. Duan | P. Hageman | M. Moret | M. Devillers | S. Rössinger | H. A. Van der Linden