FET power performance prediction using a linearized device model

An analytic model has been developed which, based on a linearized device model, describes the power output at 1-dB gain compression, optimum load impedance, and load-pull contours of a field-effect transistor (FET) explicitly in terms of device parameters. Applications of the model to practical devices including commercial metal-semiconductor FETs and a 0.25- mu m-gate modulation-doped FET showed agreement with measurements to 40 GHz.<<ETX>>

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