论文信息 - Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET - 字舞流文

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

F. Wrobel | A. Michez | R. Germanicus | V. Pouget | A. Touboul | J. Boch | K. Niskanen | A. Javanainen | F. Saigné