论文信息 - Effects of nitridation for SiO2/SiC interface on defect properties near the conduction band edge - 字舞流文

Effects of nitridation for SiO2/SiC interface on defect properties near the conduction band edge

N. Taoka | O. Nakatsuka | S. Zaima | M. Sakashita | W. Takeuchi | T. Kanemura | Kensaku Yamamoto