Honeywell radiation hardened 32-bit processor central processing unit, floating point processor, and cache memory dose rate and single event effects test results
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G. R. Brown | L. F. Hoffmann | S. C. Leavy | J. A. Mogensen | J. Brichacek | G. Brown | L. Hoffmann | S.C. Leavy | J.A. Mogensen | J. Brichacek
[1] Marian Marinescu,et al. Simple and Efficient Algorithms for Functional RAM Testing , 1982, ITC.
[2] Thomas Smith,et al. First test results of system level fault tolerant design validation through laser fault injection , 1997, Proceedings International Conference on Computer Design VLSI in Computers and Processors.