Sub-Nanometer Mapping of the Interfacial Electric Field Profile Using a Vibrational Stark Shift Ruler.
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C. Kubiak | V. Batista | T. Lian | Dhritiman Bhattacharyya | Isaac C. Tangen | Pablo E. Videla | Jinhui Meng | Joseph M. Palasz | V. Batista | Joseph M Palasz