New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis
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Susanne Hübner | Christian Boit | K. Croes | Frank Altmann | Michél Simon-Najasek | Elham Amini | Anne Beyreuther | Norbert Herfurth | R. Herfurth | C. Wu | I. De Wolf
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