Designing an accelerated degradation experiment by optimizing the estimation of the percentile

Degradation tests are widely used to assess the reliability of highly reliable products which are not likely to fail under traditional life tests or accelerated life tests. However, for some highly reliable products, the degradation may be very slow and hence it is impossible to have a precise assessment within a reasonable amount of testing time. In such cases, an alternative is to use higher stresses to extrapolate the product's reliability at the design stress. This is called an accelerated degradation test (ADT). In conducting an ADT, several decision variables, such s the inspection frequency, sample size and termination time, at each stress level are influential on the experimental efficiency. An inappropriate choice of these decision variables not only wastes experimental resources but also reduces the precision of the estimation of the product's reliability at the use condition. The main purpose of this paper is to deal with the problem of designing an ADT. By using the criterion of minimizing the mean-squared error of the estimated 100th percentile of the product's lifetime distribution at the use condition subject to the constraint that the total experimental cost does not exceed a predetermined budget, a nonlinear integer programming problem is built to derive the optimal combination of the sample size, inspection frequency and the termination time at each stress level. A numerical example is provided to illustrate the proposed method. Copyright © 2003 John Wiley & Sons, Ltd.

[1]  Luis A. Escobar,et al.  A Review of Recent Research and Current Issues in Accelerated Testing , 1993 .

[2]  Osamu Wada,et al.  Reliability of high radiance InGaAsP/InP LED́s operating in the 1.2-1.3 µm wavelength , 1981 .

[3]  M. Nikulin,et al.  Estimation in Degradation Models with Explanatory Variables , 2001, Lifetime data analysis.

[4]  M. B. Carey,et al.  Reliability assessment based on accelerated degradation: a case study , 1991 .

[5]  Jyh-Jeu Horng Shiau,et al.  Analyzing accelerated degradation data by nonparametric regression , 1999 .

[6]  W. Meeker Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .

[7]  J. Lawless Statistical Models and Methods for Lifetime Data , 2002 .

[8]  Hong-Fwu Yu,et al.  Designing a degradation experiment , 1999 .

[9]  M. Boulanger,et al.  Experimental Design for a Class of Accelerated Degradation Tests , 1994 .

[10]  Masayuki Abe,et al.  Degradation of high‐radiance Ga1−xAlxAs LED’s , 1977 .

[11]  Elizabeth A. Peck,et al.  Introduction to Linear Regression Analysis , 2001 .

[12]  E. Hille,et al.  Salas and Hille's Calculus One and Several Variables , 1995 .

[13]  Bong-Jin Yum,et al.  OPTIMAL DESIGN OF ACCELERATED DEGRADATION TESTS FOR ESTIMATING MEAN LIFETIME AT THE USE CONDITION , 1997 .

[14]  W. Nelson Statistical Methods for Reliability Data , 1998 .

[15]  J. Wolfowitz,et al.  Introduction to the Theory of Statistics. , 1951 .

[16]  S. Tseng,et al.  Step-Stress Accelerated Degradation Analysis for Highly Reliable Products , 2000 .

[17]  J. M. Ralston,et al.  Temperature and current dependence of degradation in red‐emitting GaP LED’s , 1979 .

[18]  Michael H. Kutner Applied Linear Statistical Models , 1974 .

[19]  Michael S. Hamada,et al.  Using Degradation Data to Improve Fluorescent Lamp Reliability , 1995 .